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Surface topography and speckle patterns in the <t>near</t> <t>field</t> corresponding to TMOS samples. ( a ) TMOS-13.8. ( b ) TMOS-24.2. ( c ) TMOS-32.4. ( d ) TMOS-39.1.
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Surface topography and speckle patterns in the <t>near</t> <t>field</t> corresponding to TMOS samples. ( a ) TMOS-13.8. ( b ) TMOS-24.2. ( c ) TMOS-32.4. ( d ) TMOS-39.1.
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Surface topography and speckle patterns in the <t>near</t> <t>field</t> corresponding to TMOS samples. ( a ) TMOS-13.8. ( b ) TMOS-24.2. ( c ) TMOS-32.4. ( d ) TMOS-39.1.
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Surface topography and speckle patterns in the <t>near</t> <t>field</t> corresponding to TMOS samples. ( a ) TMOS-13.8. ( b ) TMOS-24.2. ( c ) TMOS-32.4. ( d ) TMOS-39.1.
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Surface topography and speckle patterns in the near field corresponding to TMOS samples. ( a ) TMOS-13.8. ( b ) TMOS-24.2. ( c ) TMOS-32.4. ( d ) TMOS-39.1.

Journal: Sensors (Basel, Switzerland)

Article Title: Polarization-Resolved Speckle Technique for Rapid Non-Destructive Characterization of Macroporous Silica Thin Films

doi: 10.3390/s26051431

Figure Lengend Snippet: Surface topography and speckle patterns in the near field corresponding to TMOS samples. ( a ) TMOS-13.8. ( b ) TMOS-24.2. ( c ) TMOS-32.4. ( d ) TMOS-39.1.

Article Snippet: In order to corroborate in another way what is observed by SEM in 2D, that is, the non-interconnected pores, a complementary study of the samples was carried out using near-field scanning optical microscopy (alpha300 RS-Raman-SNOM Microscope-WITEC GmbH, Ulm, Germany).

Techniques: